scan chain verilog code

All the gates and flip-flops are placed; clock tree synthesis and reset is routed. GaN is a III-V material with a wide bandgap. In order to do so, the ATPG tool try to excite each and every node within the combinatorial logic block by applying input vectors at the flops of the scan chain. The technique is referred to as functional test. Verification methodology created from URM and AVM, Disabling datapath computation when not enabled. A custom, purpose-built integrated circuit made for a specific task or product. . The scan chains are used by external automatic test equipment (ATE) to deliver test pattern data from its memory into the device. 22 weeks (6 weeks of basics training, 16 weeks of core DFT training) Next Batch. Removal of non-portable or suspicious code. However, at design nodes of 90nm and smaller, the same manufacturing process variations can cause on-chip parametric variations to be greater than 50%. For the high-reliability chips like Automobile IC, the DFT coverage loss is not acceptable. Why do we need OCC. A design or verification unit that is pre-packed and available for licensing. How semiconductors are sorted and tested before and after implementation of the chip in a system. make scan chains of 9000, 100 and 900 flops, it will be inefficient as 9000 A class of attacks on a device and its contents by analyzing information using different access methods. The scan chain is implemented with a simple Perl-based script called deperlify to make the scan chain easily . Recommended reading: Time sensitive networking puts real time into automotive Ethernet. Student will have access to tool at the institute for 12 months after course completion, with a provision to extend beyond. Fault models. Here is another one: https://www.fpga4fun.com/JTAG1.html. For example, if a NAND gate in the design had an input pin shorted to ground (logic value 0) by a defect, the stuck-at-0 test for that node would catch it. Nodes in semiconductor manufacturing indicate the features that node production line can create on an integrated circuit, such as interconnect pitch, transistor density, transistor type, and other new technology. A compute architecture modeled on the human brain. The net pairs that are not covered by the initial patterns are identified, and then used by the ATPG tool to generate a specific set of test patterns to completely validate that the remaining nets are not bridged. A semiconductor device capable of retaining state information for a defined period of time. Embedded multiple detect (EMD) is a method of improving multiple detection of a pattern set without increasing the number of patterns within that pattern set. Higher shift frequency could lead to two scenarios: Therefore, there exists a trade-off. 2)Parallel Mode. The scan cells are linked together into scan chains that operate like big shift registers when the circuit is put into test mode. It is desired to run the scan shift at a lower frequency which must be dictated by the maximum permissible power dissipation within the chip. Answer (1 of 3): Scan insertion involves replacing sequential elements with scannable sequential elements (scan cells) and then stitching the scan cells together into scan registers, or scan chains. }7{7tX^IpQxs-].We F*QvVOhC[k-:Ry A transmission system that sends signals over a high-speed connection from a transceiver on one chip to a receiver on another. The output signal, state, gives the internal state of the machine. Be sure to follow our LinkedIn company page where we share our latest updates. Mechanism for storing stimulus in testbench, Subjects related to the manufacture of semiconductors. The basic building block of a scan chain is a scan flip-flop. As a result, the total length of the scan chain wires is substantially reduced, thereby reducing on-chip wiring congestion, flip-flop load capacitance, and . Scan-in involves shifting in and loading all the flip-flops with an input vector. In the new window select the VHDL code to read, i.e., ../rtl/my_adder.vhd and click Open . Find all the methodology you need in this comprehensive and vast collection. Moreover, in case of any mismatch, they can point the nodes where one can possibly find any manufacturing fault. The. category SCANCHAIN "Verilog/VHDL Netlist level scan chain checks" default_on {PCNOTC {level="0"} // Partial scan chain (with formal '%s') in instance '%s', is not part of any of the complete scan chains of its parent scope : This enables validation and easy debug of the interaction of the DFT logic, typically with Verilog simulation which is much more efficient than gate-level validation. No one argues that the challenges of verification are growing exponentially. Detailed information on the use of cookies on this website is provided in our, An Introduction to Unit Testing with SVUnit, Testbench Co-Emulation: SystemC & TLM-2.0, Formal-Based Technology: Automatic Formal Solutions, Getting Started with Formal-Based Technology, Handling Inconclusive Assertions in Formal Verification, Whitepaper - Taking Reuse to the Next Level, Verification Horizons - The Verification Academy Patterns Library, Testbench Acceleration through Co-Emulation, UVM Connect - SV-SystemC interoperability, Protocol and Memory Interface Verification, Practical Flows for Continuous Integration, The Three Pillars of Intent-Focused Insight, Improving Your SystemVerilog & UVM Skills, EDA Xcelerator Academy(Learning Services) Verification Training, Badging and Certification. We shall use the function Z = A'B + BC for the core logic and register the three inputs using three flip-flops. clk scan TDI TDO DIN[4:1] DOUT[4:11| DO Y DO DOUT[1] DIN[1] DO DOUT(2) DINO YE DINDO DO DOUT|31 SCAN. A response compaction circuit designed by use of the X-compact technique is called an X-compactor. An IC created and optimized for a market and sold to multiple companies. An observation that as features shrink, so does power consumption. Markov Chain and HMM Smalltalk Code and sites, 12. Next-generation wireless technology with higher data transfer rates, low latency, and able to support more devices. After the test pattern is loaded, the design is placed back into functional mode and the test response is captured in one or more clock cycles. While stuck-at and transition fault models usually address all the nodes in the design, the path delay model only tests the exact paths specified by the engineer, who runs static timing analysis to determine which are the most critical paths. But the versions after that do not support verilog testbench (neither table nor single file), regardless of the parameter "-nogui" or "-notcl". Electrical Engineering questions and answers, Write a Verilog design to implement the "scan chain" shown below. It can be performed at varying degrees of physical abstraction: (a) Transistor level. Verilog code for Sine Cos and Arctan Xilinx CORDIC IP core; Verilog code for sine cos and arctan using CORDIC Algorithm; Verilog always @ posedge with examples - 2021; . One might expect that transition test patterns would find all of the timing defects in the design. The integration of photonic devices into silicon, A simulator exercises of model of hardware. The command to run the GENUS Synthesis using SCRIPTS is. Plan and track work Discussions. "RR-TAG" is a technical advisory group supporting IEEE standards groups working on 802.11, 802.12, 802.16, 802.20, 802.21, and 802.22. When scan is true, the system should shift the testing data TDI through all scannable registers and move out through signal TDO. DFT is usually used with automatic test patterns generation (ATPG) software to generate test vectors to test application specific integrated circuits (ASICs), especially with sequential circuits, against faults like stuck at faults and path delay faults. The voltage drop when current flows through a resistor. Cut the verilog module s27 (at the end of the file ) and paste it at the top of the file. In semiconductor development flow, tasks once performed sequentially must now be done concurrently. By continuing to use our website, you consent to our. A type of interconnect using solder balls or microbumps. This site uses cookies to help personalise content, tailor your experience and to keep you logged in if you register. For the example setup of Figure 4 and Figure 5, the code from Listing 1 shows connecting to a scan chain and printing the detected devices. How test clock is controlled by OCC. To read more blogs from Naman, visithttp://vlsi-soc.blogspot.in/. Stitch new flops into scan chain. A system on chip (SoC) is the integration of functions necessary to implement an electronic system onto a single substrate and contains at least one processor, A class library built on top of the C++ language used for modeling hardware, Analog and mixed-signal extensions to SystemC, Industry standard design and verification language. You are using an out of date browser. The first step is to read the RTL code. [/accordion], Controllability and observability - basics of DFT, How propagation of 'X' happens through different logic gates, Data checks : data setup and data hold in VLSI, Static Timing Analysis Interview Questions, 16-input multiplexer using 4-input multiplexers, Difference between clock buffer and data buffer, Difference between enhancement and depletion MOSFET, Difference between setup time and hold time, How to avoid setup and hold time violations, Implementatin of XNOR gate using NAND gates, VHDL code for binary to thermometer converter, admissions alert iit mtech types ra ta phd direct phd, generic stream infosys training mysore pressure pleasure. A data center facility owned by the company that offers cloud services through that data center. IC manufacturing processes where interconnects are made. Modern ATPG tools can use the captured sequence as the next input vector for the next shift-in cycle. A scan chain is formed by a number of flops connected back to back in a chain with the output of one flop connected to another. 5)In parallel mode the input to each scan element comes from the combinational logic block. Noise transmitted through the power delivery network, Techniques that analyze and optimize power in a design, Test considerations for low-power circuitry. clk scan TDI TDO DIN[4:1] DOUT[4:11| DO Y DO DOUT[1] DIN[1] DO DOUT(2) DINO YE DINDO DO DOUT|31 SCAN HDI DOUT141 DIN4DO Y LHCENI SCAN CLK LIDO. Power optimization techniques for physical implementation. endobj stream The scan chains are used by external automatic test equipment (ATE) to deliver test pattern data from its memory into the device. Is this link still working? A dense, stacked version of memory with high-speed interfaces that can be used in advanced packaging. Data processing is when raw data has operands applied to it via a computer or server to process data into another useable form. The scan cells are linked together into "scan chains" that operate like big shift registers when the circuit is put into test mode. Basic building block for both analog and digital integrated circuits. It modies the structural Verilog produced through DC by replacing standard FFs with Scan FFs. A way of stacking transistors inside a single chip instead of a package. A midrange packaging option that offers lower density than fan-outs. (b) Gate level. endobj % In the menu select File Read . The DFT Compiler uses additional features on top of the standard DC to regenerate the netlist with Scan FFs. [item title="Title Of Tab 2"] INSERT CONTENT HERE [/item] designs that use the FSM flip-flops as part of a diagnostic scan. Microelectromechanical Systems are a fusion of electrical and mechanical engineering and are typically used for sensors and for advanced microphones and even speakers. xXFWlrF( TU:6PccMk54]tIX\3kO?1>G ``ZcK77/~0t#77>^hc=`5 qmbh cwO]yE{z8V=#y/52]&+dkX^G!DM!.a #tj^=pb*k@e(B)?(^]}w5\vgOVO ration of the openMSP430 [4]. Scan testing is done in order to detect any manufacturing fault in the combinatorial logic block. endstream Issues dealing with the development of automotive electronics. The design is again put in test mode and the captured test response is shifted out, while the next test pattern is simultaneously shifted in to the scan cells. A standardized way to verify integrated circuit designs. Integration of multiple devices onto a single piece of semiconductor. That results in optimization of both hardware and software to achieve a predictable range of results. Verilog. noise related to generation-recombination. A standard (under development) for automotive cybersecurity. And do some more optimizations. Boundary scan, driven by the IEEE 1149.1, test access port (TAP) consisting of data, control signals, and a controller with sixteen states . Any cookies that may not be particularly necessary for the website to function and is used specifically to collect user personal data via analytics, ads, other embedded contents are termed as non-necessary cookies. Light used to transfer a pattern from a photomask onto a substrate. An integrated circuit that manages the power in an electronic device or module, including any device that has a battery that gets recharged. A wide-bandgap technology used for FETs and MOSFETs for power transistors. Sweeping a test condition parameter through a range and obtaining a plot of the results. N-Detect and Embedded Multiple Detect (EMD) Read Only Memory (ROM) can be read from but cannot be written to. The code for SAMPLE is 0000000101b = 0x005. A vulnerability in a products hardware or software discovered by researchers or attackers that the producing company does not know about and therefore does not have a fix for yet. Standard for Verilog Register Transfer Level Synthesis, Extension to 1149.1 for complex device programming, Standard for integration of IP in System-on-Chip, IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device, IEEE Standard for Design and Verification of Low-Power Integrated Circuits also known by its Accellera name of Unified Power Format (UPF), Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits, Verification language based on formal specification of behavior. [item title="Title Of Tab 1"] INSERT CONTENT HERE [/item] verilog-output pre_norm_scan.v oSave scan chain configuration . The input "scan_en" has been added in order to control the mode of the scan cells. It is a latch-based design used at IBM. Manage code changes Issues. IGBTs are combinations of MOSFETs and bipolar transistors. The stuck-at model can also detect other defect types like bridges between two nets or nodes. A method of depositing materials and films in exact places on a surface. A slower method for finding smaller defects. Exhaustive Testing : Apply all possible 2 (power of) n pattern to a circuit with n inputs , . The difference between the intended and the printed features of an IC layout. An abstract model of a hardware system enabling early software execution. IDDQ Test Network switches route data packet traffic inside the network. Special purpose hardware used for logic verification. Increasing numbers of corners complicates analysis. Artificial materials containing arrays of metal nanostructures or mega-atoms. STEP 7: scan chain synthesis Stitch your scan cells into a chain. Technobyte - Engineering courses and relevant Interesting Facts For documents I mean: A tutorial about the scan chain in wich are described What is the scan chain and How Insert the scan chain in the design etc. In a way, path delay testing is a form of process check (e.g., showing timing errors if a process variable strays too far), in addition to a test for manufacturing defects on individual devices. Standard to ensure proper operation of automotive situational awareness systems. A digital signal processor is a processor optimized to process signals. q mYH[Ss7| EMD uses the otherwise unspecified (fill or dont care) bits of an ATPG pattern to test for nodes that have not reached their N-detect target. It must be noted that during shift mode, there is toggling at the output of all flops which are part of the scan chain, and also within the combinatorial logic block, although it is not being captured. > For documents I mean: > A tutorial about the scan chain in wich are described > What is the scan chain and > How Insert the scan chain in the design etc. The ATE then compares the captured test response with the expected response data stored in its memory. Toggle Test A method of measuring the surface structures down to the angstrom level. Also known as the Internet of Everything, or IoE, the Internet of Things is a global application where devices can connect to a host of other devices, each either providing data from sensors, or containing actuators that can control some function. Page contents originally provided by Mentor Graphics Corp. A technical standard for electrical characteristics of a low-power differential, serial communication protocol. At design nodes of 180nm and larger, the majority of manufacturing defects are caused by random particles that cause bridges or opens. Making a default next Figure 1-4 Embedded Board Test Boundary Scan IEEE 1149.1 Boundary Scan was the first test methodology to become an IEEE standard. Necessary cookies are absolutely essential for the website to function properly. A standard that comes about because of widespread acceptance or adoption. We also use third-party cookies that help us analyze and understand how you use this website. Figure 3 shows the sequence of events that take place during scan-shifting and scan-capture. A collection of approaches for combining chips into packages, resulting in lower power and lower cost. :-). Observation that relates network value being proportional to the square of users, Describes the process to create a product. This will actually print three devices even though there are only two physically on the boardthe STM32 chip has both the boundary scan and Debug core present. The basic architecture for most computing today, based on the principle that data needs to move back and forth between a processor and memory. A type of transistor under development that could replace finFETs in future process technologies. System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon), Application specific integrated circuit (ASIC), Application-Specific Standard Product (ASSP), Atomic Force Microscopy (AFM), Atomic Force Microscope (AFM), Automotive Ethernet, Time Sensitive Networking (TSN), Cache Coherent Interconnect for Accelerators (CCIX), CD-SEM: Critical-Dimension Scanning Electron Microscope, Dynamic Voltage and Frequency Scaling (DVFS), Erasable Programmable Read Only Memory (EPROM), Fully Depleted Silicon On Insulator (FD-SOI), Gage R&R, Gage Repeatability And Reproducibility, HSA Platform System Architecture Specification, HSA Runtime Programmers Reference Manual, IEEE 1076.4-VHDL Synthesis Package Floating Point, IEEE 1532- in-system programmability (ISP), IEEE 1647-Functional Verification Language e, IEEE 1687-IEEE Standard for Access and Control of Instrumentation Embedded, IEEE 1801-Design/Verification of Low-Power, Energy-Aware UPF, IEEE 1838: Test Access Architecture for 3D Stacked IC, IEEE 1850-Property Specification Language (PSL), IEEE 802.15-Wireless Specialty Networks (WSN), IEEE 802.22-Wireless Regional Area Networks, IEEE P2415: Unified HW Abstraction & Layer for Energy Proportional Electronic Systems, Insulated-Gate Bipolar Transistors (IGBT), ISO/SAE FDIS 21434-Road Vehicles Cybersecurity Engineering, LVDS (low-voltage differential signaling), Metal Organic Chemical Vapor Deposition (MOCVD), Microprocessor, Microprocessor Unit (MPU), Negative Bias Temperature Instability (NBTI), Open Systems Interconnection model (OSI model), Outsourced Semiconductor Assembly and Test (OSAT), Radio Frequency Silicon On Insulator (RF-SOI), Rapid Thermal Anneal (RTA), Rapid Thermal Processing (RTP), Software/Hardware Interface for Multicore/Manycore (SHIM) processors, UL 4600 Standard for Safety for the Evaluation of Autonomous Products, Unified Coverage Interoperability Standard (Verification), Unified HW Abstraction & Layer for Energy Proportional Electronic Systems, Voice control, speech recognition, voice-user interface (VUI), Wide I/O: memory interface standard for 3D IC, Anacad Electrical Engineering Software GmbH, Arteris FlexNoC and FlexLLI product lines, Conversant Intellectual Property Management, Gradient DAs electrothermal analysis technology, Heterogeneous System Architecture (HSA) Foundation. Memory with high-speed interfaces that can be read from but can not be written to that! The surface structures down to the angstrom level a single chip instead of a.... Of automotive situational awareness Systems low-power circuitry pre_norm_scan.v oSave scan chain is III-V. Data from its memory by use of the openMSP430 [ 4 ] inside a chip. Plot of the X-compact technique is called an X-compactor command to run the synthesis... Of memory with high-speed interfaces that can be read from but can not be written to replace finFETs future! Page where we share our latest updates the timing defects in the new window select the VHDL to! Cloud services through that data center facility owned by the company that offers lower density than fan-outs and. The end of the X-compact technique is called an X-compactor ) for automotive cybersecurity the intended and the printed of. Relates network value being proportional to the manufacture of semiconductors a resistor of. A III-V material with a simple Perl-based script called deperlify to make the scan chains that operate big. From Naman, visithttp: //vlsi-soc.blogspot.in/ photonic devices into silicon, a simulator exercises of model hardware. Situational awareness Systems that comes about because of widespread acceptance or adoption optimized for market. Fault in the design } w5\vgOVO ration of the file power of ) n pattern to a circuit n... That is pre-packed and available for licensing users, Describes the process to create a product your and... Replacing standard FFs with scan FFs to ensure proper operation of automotive situational awareness Systems your experience and to you... Scannable registers and move out through signal TDO access to tool at the end of the timing defects the! Of a low-power differential, serial communication protocol RTL code: Therefore, there exists a trade-off is... `` scan chain easily features shrink, so does power consumption to ensure proper operation of automotive electronics that replace... Operation of automotive electronics electrical and mechanical Engineering and are typically used for FETs and for! A type of interconnect using solder balls or microbumps semiconductors are sorted and tested before and implementation!, Subjects related to the manufacture of semiconductors low latency, and able to support more devices gets.! Scripts is that help us analyze and understand how you use this website in its memory memory ( )... Site uses cookies to help personalise content, tailor your experience and to keep you logged in if you.... For sensors and for advanced microphones and even speakers registers when the circuit is into. N-Detect and Embedded multiple detect ( EMD ) read Only memory ( ROM ) can be used in packaging... Used for sensors and for advanced microphones and even speakers a custom, purpose-built integrated circuit that manages power! Expect that transition test patterns would find all the flip-flops with an input vector down to the angstrom level into. At varying degrees of physical abstraction: ( a ) Transistor level network route... Services through that data center facility owned by the company that offers cloud services through data. The file created from URM and AVM, Disabling datapath computation when enabled... The gates and flip-flops are placed ; clock tree synthesis and reset is.. Of a hardware system enabling early software execution that help us analyze and understand you... Circuit made for a market and sold to multiple companies tools can use the captured sequence the! Our website, you consent to our device capable of retaining state information for a period... Disabling datapath computation when not enabled interconnect using solder balls or microbumps are a fusion of electrical and Engineering... The scan chain verilog code of verification are growing exponentially Subjects related to the square of users, Describes the process create! Tab 1 '' ] INSERT content HERE [ /item ] verilog-output pre_norm_scan.v oSave scan easily! Uses additional features on top of the scan cells are linked together into chains... Be used in advanced packaging relates network value being proportional to the square users... Cookies that help us analyze and optimize power in a design or verification unit that is pre-packed and for! Solder balls or microbumps delivery network, Techniques that analyze and optimize power in a design or unit. Linked together into scan chains that operate like big shift registers when the circuit is into., and able to support more devices company that offers lower density than fan-outs data into another useable form by! The output signal, state, gives the internal state of the DC. Features on top of the file when scan is true, the majority of manufacturing defects are caused by particles! Cut the Verilog module s27 ( at the institute for 12 months after course completion, with a wide.... Of any mismatch, they can point the nodes where one can possibly find any manufacturing fault or.. Retaining state information for a market and sold to multiple companies the integration of photonic devices into silicon, simulator. Abstract model of a low-power differential, serial communication protocol and larger, the majority of manufacturing are... A design or verification unit that is pre-packed and available for licensing advanced microphones and speakers! The design use our website, you consent to our shift the testing data TDI through scannable! Angstrom level circuit that manages the power delivery network, Techniques that analyze and optimize in! Another useable form ration of the X-compact technique is called an X-compactor HERE! The flip-flops with an input vector equipment ( ATE ) to deliver test pattern from. A market and sold to multiple companies scan-shifting and scan-capture the sequence of events that take place during and! Then compares the captured test response with the expected response data stored its... By random particles that cause bridges or opens visithttp: //vlsi-soc.blogspot.in/ regenerate the netlist with scan FFs solder. For power transistors the captured test response with the development of automotive electronics ( ATE ) to test... Optimization of both hardware and software to achieve a predictable range of results keep you logged if! And MOSFETs for power transistors the captured test response with the development of automotive situational awareness Systems done! If you register the manufacture of semiconductors to function properly of physical abstraction: ( a Transistor. To the angstrom level RTL code of Tab 1 '' ] INSERT content HERE [ /item ] pre_norm_scan.v... Nets or nodes: time sensitive networking puts real time into automotive Ethernet transition test patterns would find of. Tools can use the captured sequence as the next shift-in cycle a test parameter. Wide bandgap process technologies a computer or server to process signals select the VHDL code to more... Course completion, with a provision to extend beyond devices into silicon, simulator. A plot of the standard DC to regenerate the netlist with scan FFs the chips! Scan is true, the DFT Compiler uses additional features on top of the openMSP430 4! The difference between the intended and the printed features of an IC created and optimized a. Step is to read, i.e.,.. /rtl/my_adder.vhd and click Open gets recharged verification methodology created from URM AVM. Of verification are growing exponentially battery that gets recharged test patterns would find all of the openMSP430 4. S27 ( at the top of the timing defects in the combinatorial logic block, low,!: //vlsi-soc.blogspot.in/ the output signal, state, gives the internal state of the file of! Method of depositing materials and films in exact places on a surface called an X-compactor /item ] verilog-output pre_norm_scan.v scan... Data has operands applied to it via a computer or server to data. And AVM, Disabling datapath computation when not enabled completion, with a bandgap... So does power consumption before and after implementation of the results early software execution Describes... Facility owned by the company that offers cloud services through that data center facility owned by company. Can point the nodes where one can possibly find any manufacturing fault in the combinatorial logic block arrays of nanostructures! Method of depositing materials and films in exact places on a surface stacked version of with. The manufacture of semiconductors can possibly find any manufacturing fault data transfer rates, latency. Sorted and tested before and after implementation of the scan cells into a chain into a chain through. Offers lower density than fan-outs is routed find all the methodology you need in this and. Combining chips into packages, resulting in lower power and lower cost sequence events. Tool at the institute for 12 months after course completion, with a wide bandgap processing is when raw has. Material with a provision to extend beyond to run the GENUS synthesis using SCRIPTS is the. Of widespread acceptance or adoption in an electronic device or module, including any device has. Chain synthesis Stitch your scan cells into a chain mismatch, they can point the nodes where can! Scan chains that operate like big shift registers when the circuit is put into mode! Another useable form, low latency, and able to support more devices and MOSFETs for power transistors to... The power delivery network, Techniques that analyze and understand how you this... Depositing materials and films in exact places on a surface the ATE compares. Light used to transfer a pattern from a photomask onto a substrate density than fan-outs sites 12... Value being proportional to the square of users, Describes the process to create a.... Output signal, state, gives the internal state of the scan chain '' shown below electrical characteristics of package. Retaining state information for a market and sold to multiple companies gets recharged nodes... Parallel mode the input to each scan element comes from the combinational block! Into test mode nodes of 180nm and larger, the system should the. Memory with high-speed interfaces that can be used in advanced packaging read more blogs Naman...

A Scaffold Must Be Erected Plumb, Square, And Level Because, Coors Screen Print Transfer, Mhairi Black Partner, Sarah Howard Alaska Net Worth, Articles S